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WTS-2000 ICT/ATE Electrical Test System

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                     FUNCTION

 v Pos. and Neg. images can be merged automatically.
 v Angular or polygonal PAD can be converted to FLASH
     structure image.
 v Parameters can be defined by users, to meet every
     requirements.
 v Autoimport D-CODE table.
 v Easy to Insert/Remove/Shift without re-process.
 v SMD Zig-Zag division pin set automatically and print out
     estimate.          


‧D-code TABLE SETUP& AUTO-import



‧Working Configure for ICT：Parameters Can be defined by users

‧Users customize test point of D-Code value

‧Easy working layer setup

‧Multi Drill File setting for blind via hole
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